DocumentCode
2412606
Title
Gene cluster profile vectors: A novel method to infer functional coupling using both gene proximity and co-occurrence profiles
Author
Pejaver, Vikas Rao ; Kim, Sun
Author_Institution
Sch. of Inf. & Comput., Indiana Univ., Bloomington, IN, USA
fYear
2010
fDate
18-21 Dec. 2010
Firstpage
29
Lastpage
34
Abstract
Proximity-based methods and co-evolution-based phylogenetic profiles methods have been successfully used for the identification of functionally related genes. Proximity-based methods are effective for physically clustered genes while the phylogenetic profiles method is effective for co-occurring gene sets. However, both methods predict many false positives and false negatives. In this paper, we propose the Gene Cluster Profile Vector (GCPV) method, which combines these two methods by using phylogenetic profiles of whole gene clusters. Moreover, the GCPV method is, currently, the only method that allows for the characterization of relationships between gene clusters themselves. The GCPV method groups together reasonably related operons in E. coli about 60% of the time. The method is minimally dependent on the reference genome set used and it outperforms the conventional phylogenetic profiles method. Finally, we show that the method works well for predicted gene clusters from C. crescentus and can serve as an important tool not only for understanding gene function, but also for elucidating mechanisms of general biological processes.
Keywords
bioinformatics; evolution (biological); genetics; microorganisms; pattern clustering; vectors; C. crescentus; E. coli; coevolution-based phylogenetic profiles methods; gene cluster profile vectors; gene proximity; proximity-based methods; reference genome; Assembly; Bioinformatics; Biological processes; Correlation; Genomics; Phylogeny; Prediction algorithms; cosine similarity; functional relationships; gene clusters; genome annotation; phylogenetic profiles;
fLanguage
English
Publisher
ieee
Conference_Titel
Bioinformatics and Biomedicine (BIBM), 2010 IEEE International Conference on
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-8306-8
Electronic_ISBN
978-1-4244-8307-5
Type
conf
DOI
10.1109/BIBM.2010.5706530
Filename
5706530
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