Modeling noise transfer characteristic of dynamic logic gates

Dynamic noise analysis is recently gaining more attention as a definitive method to overcome glaring deficiencies of static noise analysis. Exact dynamic noise analysis requires modeling of both injected noise and propagated noise. In this paper, we have developed a strategy to study the noise propagation problem. An efficient analytical formula has been derived to accurately model the noise waveform transfer characteristic of dynamic CMOS logic gates. Experiments have shown that the maximum error in peak propagated noises of the proposed model is less than 10%.