Self-testing embedded checkers for Bose-Lin, Bose, and a class of Borden codes

A new approach for designing t-UED and BUED code checkers is presented. In particular we consider Borden codes for t=2^k-1, Bose and Bose-Lin codes. The design technique for all three checker types follows the same principle, which is mainly based on averaging weights and check symbol values of the code words. The checkers are very well suited for use as embedded checkers since they are self-testing with respect to single stuck-at faults under very weak assumptions. All three checker types can be tested by 2 or 3 code words.