Title :
Optimized resolution-level for input-output control of 3ϕ VS WM AC-DC converters
Author :
Saleh, S.A. ; Rahman, M.A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of New Brunswick, Fredericton, NB, Canada
Abstract :
The switching pulses generated by the wavelet modulation technique represent sets of scaled and translated synthesis scale-based linearly-combined wavelet basis functions. The duration and location of each switching pulse are determined by the scale. In this paper, a novel controller is developed and tested for three phase, voltage source, 6-pulse wavelet modulated ac-dc converters. The proposed controller is structured to determine the maximum value of the scale j based on two phase shift angles. The first phase shift angle θI is defined to adjust the generated switching pulses in response to changes in the converter input three phase voltages. The second phase shift angle θO is defined to adjust the generated switching pulses in order to ensure the output dc voltage follows its command value. The optimized resolution-level controller is implemented for simulation and experimental testing for input three phase voltages with unbalances, as well as step changes in the command output dc voltage. Test results demonstrate fast responses, accurate adjustments and good dynamics to ensure the output dc voltage follows its command value regardless of the state of the 3φ input voltages.
Keywords :
AC-DC power convertors; wavelet transforms; 3φ VS WM AC-DC converters; 6-pulse wavelet modulated AC-DC converters; generated switching pulses; input-output control; optimized resolution-level; optimized resolution-level controller; phase shift angles; translated synthesis scale-based linearly-combined wavelet basis functions; voltage source AC-DC converters; wavelet modulation technique; AC-DC power converters; Equations; Frequency modulation; Mathematical model; Multiresolution analysis; Switches; Voltage control; AC-DC power converters; power system harmonics; the sampling theorem; wavelet transforms;
Conference_Titel :
Industry Applications Society Annual Meeting (IAS), 2012 IEEE
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4673-0330-9
Electronic_ISBN :
0197-2618
DOI :
10.1109/IAS.2012.6374012