DocumentCode :
2413120
Title :
Automatic generation of simulation monitors from quantitative constraint formula [system-level verification]
Author :
Chen, Xi ; Hsieh, Harry ; Balarin, Felice ; Watanabe, Yosinori
Author_Institution :
Univ. of California, Riverside, CA, USA
fYear :
2003
fDate :
2003
Firstpage :
1174
Lastpage :
1175
Abstract :
System design methodology is poised to become the next big enabler for highly sophisticated electronic products. Design verification continues to be a major challenge and simulation will remain an important tool for making sure that implementations perform as they should. In this paper we present algorithms to automatically generate C++ checkers from any formula written in the formal quantitative constraint language, logic of constraints (LOC). The executable can then be used to analyze the simulation traces for constraint violation and output debugging information. Different checkers can be generated for fast analysis under different memory limitations. LOC is particularly suitable for specification of system level quantitative constraints where relative coordination of instances of events, not lower level interaction, is of paramount concern. We illustrate the usefulness and efficiency of our automatic trace analysis methodology with case studies on large simulation traces from various system level designs.
Keywords :
C++ language; constraint handling; embedded systems; formal specification; formal verification; logic design; logic simulation; C++ checkers; LOC; automatic simulation monitor generation; automatic trace analysis; constraint violation; embedded systems; event instances relative coordination; formal quantitative constraint language; logic of constraints; output debugging; quantitative constraint formula; system level specification; system-level verification; Analytical models; Automatic logic units; Consumer electronics; Debugging; Information analysis; Lab-on-a-chip; Laboratories; Logic design; Product design; System-level design;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2003
ISSN :
1530-1591
Print_ISBN :
0-7695-1870-2
Type :
conf
DOI :
10.1109/DATE.2003.1253787
Filename :
1253787
Link To Document :
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