DocumentCode
2413201
Title
Simple Statistical Analysis Techniques to Determine Minimum Sense Amp Set Times
Author
Houle, Robert
Author_Institution
IBM, Essex
fYear
2007
fDate
16-19 Sept. 2007
Firstpage
37
Lastpage
40
Abstract
Simple statistical analysis techniques are described, involving a relatively small number of actual circuit simulations, to accurately determine the minimum required sense amp set time for memory designs. Techniques to generate and evaluate the statistical distributions for signal development, leakage and sense amp asymmetry are discussed with important implications to sense amp design.
Keywords
SRAM chips; circuit simulation; memory architecture; statistical distributions; circuit simulations; memory designs; minimum sense amp set times; sense amp asymmetry; signal development; statistical analysis techniques; statistical distributions; Circuit simulation; Degradation; Multiplexing; Random access memory; Signal design; Signal generators; Stability; Statistical analysis; Statistical distributions; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 2007. CICC '07. IEEE
Conference_Location
San Jose, CA
Print_ISBN
978-1-4244-1623-3
Electronic_ISBN
978-1-4244-1623-3
Type
conf
DOI
10.1109/CICC.2007.4405677
Filename
4405677
Link To Document