• DocumentCode
    2413201
  • Title

    Simple Statistical Analysis Techniques to Determine Minimum Sense Amp Set Times

  • Author

    Houle, Robert

  • Author_Institution
    IBM, Essex
  • fYear
    2007
  • fDate
    16-19 Sept. 2007
  • Firstpage
    37
  • Lastpage
    40
  • Abstract
    Simple statistical analysis techniques are described, involving a relatively small number of actual circuit simulations, to accurately determine the minimum required sense amp set time for memory designs. Techniques to generate and evaluate the statistical distributions for signal development, leakage and sense amp asymmetry are discussed with important implications to sense amp design.
  • Keywords
    SRAM chips; circuit simulation; memory architecture; statistical distributions; circuit simulations; memory designs; minimum sense amp set times; sense amp asymmetry; signal development; statistical analysis techniques; statistical distributions; Circuit simulation; Degradation; Multiplexing; Random access memory; Signal design; Signal generators; Stability; Statistical analysis; Statistical distributions; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2007. CICC '07. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-1623-3
  • Electronic_ISBN
    978-1-4244-1623-3
  • Type

    conf

  • DOI
    10.1109/CICC.2007.4405677
  • Filename
    4405677