• DocumentCode
    2413280
  • Title

    Test data compression based on output dependence

  • Author

    Pomeranz, Irith ; Reddy, Sudhakar M.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2003
  • fDate
    2003
  • Firstpage
    1186
  • Lastpage
    1187
  • Abstract
    In a large circuit it is common to find that an output of the circuit depends structurally on a proper subset of the circuit inputs. We use this observation to provide test data compression. The proposed approach can be used in addition to test data compression techniques based on encoding.
  • Keywords
    automatic test pattern generation; data compression; logic testing; ATPG; output dependence; test application scheme; test data compression; Circuit faults; Circuit testing; Cities and towns; Data compression; Encoding; Fault detection; Test data compression;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2003
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-1870-2
  • Type

    conf

  • DOI
    10.1109/DATE.2003.1253793
  • Filename
    1253793
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2413280