• DocumentCode
    2413336
  • Title

    Multi-Bit Sigma Delta ADC with Reduced Feedback Levels, Extended Dynamic Range and Increased Tolerance for Analog Imperfections

  • Author

    Wu, Jian-Yi ; Subramoniam, Raj ; Zhang, Zhenyong ; Djabbari, Ali ; Holloway, Peter ; Maloberti, Franco ; Yousefi, Masood ; Aslan, Mehmet ; Hong, Hua ; Bahai, Ahmad

  • Author_Institution
    Nat. Semicond., Santa Clara
  • fYear
    2007
  • fDate
    16-19 Sept. 2007
  • Firstpage
    77
  • Lastpage
    80
  • Abstract
    A novel second order sigma delta modulator (SDM) with 5-bit quantizer has been proposed with simplified DAC arrays, high-order truncation noise shaping for increased tolerance to analog imperfections, and extended dynamic range for a maximum input signal swing of up to -0.45 dBFS. With truncation filter and pseudo SDM in the DSP, the truncation and saturation errors are compensated through the DAC arrays and the DSP. The design was fabricated in 0.18mu dual gate oxide (DGO) process. A SNDR (signal-to-noise-and-distortion ratio) of 98.4 dB and a SNR (signal-to-noise ratio) of 108-dB were measured for a 31.25-KHz signal bandwidth at 8-MHz sampling frequency with a power consumption of about 14.7 mW.
  • Keywords
    circuit feedback; sigma-delta modulation; DSP; analog imperfections; bandwidth 31.25 kHz; dual gate oxide process; extended dynamic range; frequency 8 MHz; high-order truncation noise shaping; multi-bit sigma delta ADC; noise figure 108 dB; noise figure 98.4 dB; power 14.7 mW; pseudo SDM; reduced feedback levels; second order sigma delta modulator; signal-to-noise-and-distortion ratio; simplified DAC arrays; truncation filter; Delta modulation; Delta-sigma modulation; Digital signal processing; Dynamic range; Feedback; Filters; Frequency measurement; Noise shaping; Power measurement; Signal to noise ratio;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2007. CICC '07. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-1623-3
  • Electronic_ISBN
    978-1-4244-1623-3
  • Type

    conf

  • DOI
    10.1109/CICC.2007.4405685
  • Filename
    4405685