Title :
The "point" potential distribution research with use of the measuring computer system
Author :
Grishenko, V.L. ; Matveeva, I.A.
Author_Institution :
Sci.-Res. Inst. of Mechanic & Phys., Chemyshevski Saratov State Univ., Russia
Abstract :
The measuring computer system (MCS) have been designed and created for noncontact nondestructive measurement of potential and charge surface distributions. Special potential "point" tests have been designed and created for determination of MCS space resolution and sensitivity. Experimental results of test potential distribution research are considered.
Keywords :
charge measurement; computerised instrumentation; surface potential; voltage measurement; measuring computer system; noncontact nondestructive measurement; point potential distribution; surface charge distribution; surface potential distribution; Charge measurement; Current measurement; Distributed computing; Testing;
Conference_Titel :
Actual Problems of Electron Devices Engineering, 2002. (APEDE 2002). Fifth International Conference on
Conference_Location :
Saratova, Russia
Print_ISBN :
5-7433-1065-3
DOI :
10.1109/APEDE.2002.1044945
