Title :
Embedded Test Features for High-Speed Serial I/O
Author_Institution :
Mile High Design Center, Fort Collins
Abstract :
High-speed serial I/O interfaces are becoming ubiquitous, yet remain very challenging to test effectively and efficiently (or even at all) during high volume production. The use of on-chip test and measurement circuitry to assist or replace external equipment is an emerging paradigm to address the issue. A brief survey of these embedded test features and their optimization for HVM support, plus an overview of the activity of the IEEE P1687 working group, is presented.
Keywords :
application specific integrated circuits; computer interfaces; embedded systems; input-output programs; embedded test features; high speed serial I/O interfaces; measurement circuitry; on chip test; Circuit testing; Counting circuits; Design for testability; Instruments; Laboratories; Life testing; Manufacturing processes; Pins; Production; Test pattern generators;
Conference_Titel :
Custom Integrated Circuits Conference, 2007. CICC '07. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-1623-3
Electronic_ISBN :
978-1-4244-1623-3
DOI :
10.1109/CICC.2007.4405702
