• DocumentCode
    2413869
  • Title

    Power-performance system-level exploration of a MicroSPARC2-based embedded architecture

  • Author

    Palermo, Gianluca ; Silvano, Cristina ; Zaccaria, Vittorio

  • Author_Institution
    Dipt. di Elettronica e Informazione, Politecnico di Milano, Italy
  • fYear
    2003
  • fDate
    2003
  • Firstpage
    182
  • Abstract
    This paper describes the architectural exploration of the system-level parameters for a MicroSPARC2-based embedded system. The overall goal of the exploration task is to quickly identify the best architecture of the embedded system in terms of both energy and delay parameters, avoiding a comprehensive analysis of the architectural design space. The energy-delay product (EDP) has been adopted as the evaluation metric to compare the alternative architectures in terms of different cache memory and bus subsystems. The exploration phase adopts an iterative local-search algorithm based on the sensitivity analysis of the cost function with respect to the tuning parameters of the system architecture. The exploration targets the architectural optimisation of the parameters related to the cache memory and the bus sub-systems of an embedded architecture based on the MicroSPARC2 architecture executing the set of Mediabench benchmarks for multimedia applications. The experimental results have shown a reduction up to nine orders of magnitude of the number of design alternatives analyzed during the exploration phase.
  • Keywords
    cache storage; embedded systems; logic design; low-power electronics; microcomputers; multimedia computing; sensitivity analysis; system buses; MicroSPARC2-based embedded architecture; bus subsystems; cache memory; cost function sensitivity analysis; design space exploration; energy-delay product; iterative local-search algorithm; low-power systems; microprocessor-based embedded system; multimedia applications; power-performance system-level exploration; system architecture tuning parameters; Europe; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2003
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-1870-2
  • Type

    conf

  • DOI
    10.1109/DATE.2003.1253826
  • Filename
    1253826