Title :
SoC design and test considerations
Author :
Schrader, Martin ; McConnell, Roderick
Abstract :
Modern SoC design for high-volume products requires a strong focus on design-for-test and design-for-manufacturability. We present a case study of an SoC test concept, including a description of the DFT and DFM features included in the SoC device and a brief motivation for their utility.
Keywords :
design for manufacture; design for testability; integrated circuit design; integrated circuit testing; system-on-chip; DFM; DFT; SoC design; SoC test; design-for-manufacturability; design-for-test; high-volume products; system-on-chip; Built-in self-test; Circuit testing; Logic testing; Microcontrollers; Phase locked loops; Pulse width modulation; Random access memory; System testing; System-on-a-chip; Voltage control;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2003
Print_ISBN :
0-7695-1870-2
DOI :
10.1109/DATE.2003.1253829
