Author :
Grote, H. ; Iselin, F.C. ; Keil, E. ; Niederer, J.
Author_Institution :
CERN, Geneva, Switzerland
Abstract :
The Methodical Accelerator Design (MAD) program for circular accelerators is in regular use for the design and modeling of the Large Electron Positron Collider (LEP), the Large Hadron Collider (LHC), the Proton Synchrotron (PS), and the Super Proton Synchrotron (SPS) at CERN, and in 10 to 20 other laboratories. It includes the following new accelerator physics features: (i) machine imperfections, e.g. random and systematic errors in the alignment and excitation of the magnetic elements and read-out errors of the beam-position monitors; (ii) closed-orbit correction using the MICADO algorithm; (iii) Lie-algebraic techniques for concatenating beam lines, for tracking trajectories, and for higher-order orbit functions; (iv) systematic energy loss due to synchrotron radiation and its effects on the closed orbit and the orbit functions in all three degrees of freedom; and (v) spin dynamics in SMILE style. The data describing the machine are held as data modules in a dynamically managed memory pool, including garbage collection and overflow onto external files. Graphics is interfaced to the standard graphics kernel system (GKS) and used for plotting orbit functions along the orbit and versus the momentum error, and for phase space plots, Fourier spectra of particle orbits, etc. MAD is implemented on Cray, IBM, Nord, and VAX systems and on Apollo and sun workstations
Keywords :
computer graphics; particle beam diagnostics; physics computing; Fourier spectra; LEP; LHC; Large Electron Positron Collider; Large Hadron Collider; Lie-algebraic techniques; MAD program; PS; Proton Synchrotron; SPS; Super Proton Synchrotron; circular accelerators; closed-orbit correction; energy loss; errors; graphics kernel system; machine imperfections; orbit functions; particle orbits; phase space plots; spin dynamics; synchrotron radiation;
Conference_Titel :
Particle Accelerator Conference, 1989. Accelerator Science and Technology., Proceedings of the 1989 IEEE
Conference_Location :
Chicago, IL
DOI :
10.1109/PAC.1989.73426