DocumentCode :
2414368
Title :
Low-Power and High-Speed Pipelined ADC Using Time-Aligned CDS Technique
Author :
Kook, Youn-Jae ; Li, Jipeng ; Lee, Bumha ; Moon, Un-Ku
Author_Institution :
Oregon State Univ., Corvallis
fYear :
2007
fDate :
16-19 Sept. 2007
Firstpage :
321
Lastpage :
324
Abstract :
Time-aligned correlated double sampling (CDS) technique, which overcomes the error accumulation problem found in the time-shifted CDS technique, is proposed. This technique allows low gain opamp based switched-capacitor operation to achieve the equivalent accuracy that is traditionally possible only in high gain opamp based switched-capacitor operation. This allows simple single stage opamps to be used, leading to low-power and high-speed performance. As a proof of concept, a prototype pipelined analog-to-digital converter (ADC) is fabricated in a 0.18 mum CMOS process. Measured results demonstrate 1.8V 10b 100 MS/s 50 mW ADC.
Keywords :
CMOS integrated circuits; analogue-digital conversion; capacitor switching; operational amplifiers; CMOS process; error accumulation problem; high-speed pipelined ADC; low gain opamp; low-power ADC; pipelined analog-to-digital converter; power 50 mW; switched-capacitor operation; time-aligned CDS technique; time-aligned correlated double sampling technique; time-shifted CDS technique; voltage 1.8 V; Analog-digital conversion; CMOS process; Calibration; Capacitors; Circuits; Gain measurement; Moon; Pipelines; Prototypes; Sampling methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 2007. CICC '07. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-1623-3
Electronic_ISBN :
978-1-4244-1623-3
Type :
conf
DOI :
10.1109/CICC.2007.4405743
Filename :
4405743
Link To Document :
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