DocumentCode
2414434
Title
A 57 dB SFDR digitally calibrated 500 MS/s folding ADC in 0.18 μm digital CMOS
Author
Bogue, Ivan ; Flynn, Michael P.
Author_Institution
Michigan Univ., Ann Arbor
fYear
2007
fDate
16-19 Sept. 2007
Firstpage
337
Lastpage
340
Abstract
A digitally calibrated 8-bit folding ADC incorporating redundancy and reassignment is described. Small, redundant folder and comparator circuits generate 1024 available zero-crossings. An entirely self-contained calibration engine selects 255 zero-crossings from the available set. Unselected circuits are powered down. The calibration breaks the link between ADC performance and analog accuracy, allowing small transistors to be used in the signal path. Fabricated in 0.18 μm digital CMOS, the DNL of the uncalibrated ADC is 6.7 LSB and 0.8 LSB, before and after calibration, respectively. SFDR remains above 55 dB up to a sampling rate of 550 MS/s. The total die area is 1.2mm2.
Keywords
CMOS digital integrated circuits; analogue-digital conversion; comparators (circuits); SFDR digitally calibrated ADC; comparator circuits; digital CMOS; folding ADC; size 0.18 μm; CMOS digital integrated circuits; Calibration; Engines; Pipelines; Prototypes; Random access memory; Sampling methods; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 2007. CICC '07. IEEE
Conference_Location
San Jose, CA
Print_ISBN
978-1-4244-0786-6
Electronic_ISBN
978-1-4244-1623-3
Type
conf
DOI
10.1109/CICC.2007.4405747
Filename
4405747
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