• DocumentCode
    2414434
  • Title

    A 57 dB SFDR digitally calibrated 500 MS/s folding ADC in 0.18 μm digital CMOS

  • Author

    Bogue, Ivan ; Flynn, Michael P.

  • Author_Institution
    Michigan Univ., Ann Arbor
  • fYear
    2007
  • fDate
    16-19 Sept. 2007
  • Firstpage
    337
  • Lastpage
    340
  • Abstract
    A digitally calibrated 8-bit folding ADC incorporating redundancy and reassignment is described. Small, redundant folder and comparator circuits generate 1024 available zero-crossings. An entirely self-contained calibration engine selects 255 zero-crossings from the available set. Unselected circuits are powered down. The calibration breaks the link between ADC performance and analog accuracy, allowing small transistors to be used in the signal path. Fabricated in 0.18 μm digital CMOS, the DNL of the uncalibrated ADC is 6.7 LSB and 0.8 LSB, before and after calibration, respectively. SFDR remains above 55 dB up to a sampling rate of 550 MS/s. The total die area is 1.2mm2.
  • Keywords
    CMOS digital integrated circuits; analogue-digital conversion; comparators (circuits); SFDR digitally calibrated ADC; comparator circuits; digital CMOS; folding ADC; size 0.18 μm; CMOS digital integrated circuits; Calibration; Engines; Pipelines; Prototypes; Random access memory; Sampling methods; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2007. CICC '07. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-0786-6
  • Electronic_ISBN
    978-1-4244-1623-3
  • Type

    conf

  • DOI
    10.1109/CICC.2007.4405747
  • Filename
    4405747