Title :
Records of the IEEE International Workshop on Memory Technology, Design and Testing
Abstract :
The following topics were dealt with: failure mechanism and defects; Flash/EEPROM design; new ideas; test and yield; memory testing and built-in-self-test; memory design; and diagnosis
Keywords :
circuit testing; fault diagnosis; integrated memory circuits; memory architecture; EEPROM; Flash memories; built-in-self-test; defects; diagnosis; failure mechanism; memory design; memory testing;
Conference_Titel :
High-Performance Distributed Computing, 2000. Proceedings. The Ninth International Symposium on
Conference_Location :
Pittsburgh, PA, USA
Print_ISBN :
0-7695-0783-2
DOI :
10.1109/HPDC.2000.868669
