Title :
A sub-pW timer using gate leakage for ultra low-power sub-Hz monitoring systems
Author :
Lin, Yu-Shiang ; Sylvester, Dennis ; Blaauw, David
Author_Institution :
Michigan Univ., Ann Arbor
Abstract :
In this work, we present a novel ultra-low power timer designed using the gate leakage of MOS capacitors. The test chip was fabricated in a 0.13 mum CMOS technology and the total circuit area is 480 mum2. Measurement results show that the circuit functions correctly at a wide range of supply voltages from 300 mV to 1.2 V, making it particularly suitable for subthreshold systems. The temperature sensitivity is 0.16%/degC at 600 mV and 0.6%/degC at 300 mV. The power dissipation is less than 1pW running at 20degC and 300 mV.
Keywords :
CMOS integrated circuits; MOS capacitors; CMOS technology; MOS capacitors; gate leakage; power dissipation; ultra-low power timer; voltage 300 mV to 1.2 V; CMOS technology; Circuit testing; Gate leakage; MOS capacitors; Monitoring; Particle measurements; Power dissipation; Semiconductor device measurement; Temperature sensors; Voltage;
Conference_Titel :
Custom Integrated Circuits Conference, 2007. CICC '07. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-1623-3
Electronic_ISBN :
978-1-4244-1623-3
DOI :
10.1109/CICC.2007.4405761