• DocumentCode
    2414948
  • Title

    Quantitative comparison of high-resolution MRI and myelin-stained histology of the human cerebral cortex

  • Author

    Osechinskiy, Sergey ; Kruggel, Frithjof

  • Author_Institution
    Dept. of Biomed-ical Eng., Univ. of California, Irvine, CA, USA
  • fYear
    2009
  • fDate
    3-6 Sept. 2009
  • Firstpage
    85
  • Lastpage
    89
  • Abstract
    The architectonic analysis of the human cerebral cortex is presently based on the examination of stained tissue sections. Recent progress in high-resolution magnetic resonance imaging (MRI) promotes the feasibility of an in vivo architectonic analysis. Since the exact relationship between the laminar fine-structure of a cortical MRI signal and histological cyto-and myeloarchitectonic staining patterns is not known, a quantitative study comparing high-resolution MRI to histological ground truth images is necessary for validating a future MRI based architectonic analysis. This communication describes an ongoing study comparing post mortem MR images to a myelin-stained histology of the brain cortex. After establishing a close spatial correspondence between histological sections and MRI using a slice-to-volume nonrigid registration algorithm, transcortical intensity profiles, extracted from both imaging modalities along curved trajectories of a Laplacian vector field, are compared via a cross-correlational analysis.
  • Keywords
    biological tissues; biomedical MRI; brain; image registration; medical image processing; architectonic analysis; high resolution MRI; human cerebral cortex; magnetic resonance imaging; myelin stained histology; nonrigid registration algorithm; post mortem MR images; Algorithms; Cerebral Cortex; Humans; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Magnetic Resonance Imaging; Nerve Fibers, Myelinated;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE
  • Conference_Location
    Minneapolis, MN
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-3296-7
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2009.5334695
  • Filename
    5334695