Adaptive scenario-based object-oriented test frameworks for testing embedded systems

This paper presents a process to develop adaptive object-oriented scenario-based test frameworks for testing embedded systems. Embedded systems often require rigorous testing due to the mission-critical nature of their applications, and they are often developed as a family of products. The process uses techniques such as design-for-change, design patterns, scenarios, ripple effect analysis, and regression testing. This paper then uses an example to illustrate this process by applying it to test a mobile phone system, and the framework constructed can facilitate generation of numerous test cases quickly with minimum effort, and it can also accommodate many changes suggested by another party without changing the overall structure of the framework