DocumentCode
241502
Title
A PVT variation testing and compensating method for sigle-chip digital- analog mixed TCXO
Author
Haixiao Li ; Shulong Li ; Dong Wu ; Liyang Pan
Author_Institution
Instn. of Microelectron., Tsinghua Univ., Beijing, China
fYear
2014
fDate
28-31 Oct. 2014
Firstpage
1
Lastpage
3
Abstract
In this paper, a novel test method is proposed to compensate the PVT variation induced error for a single-chip digital-analog mixed temperature-compensated crystal oscillation (TCXO). Based on the testable design of single-chip TCXO, the on-chip verification (OCV) can be effectively realized by ordinary external test system, and the proposed method can thoroughly cover the PVT variation, therefore realize a high precision.
Keywords
compensation; crystal oscillators; OCV; PVT variation testing; compensation method; on-chip verification; sigle-chip digital-analog mixed TCXO; temperature-compensated crystal oscillation; Abstracts; Crystals; Field programmable gate arrays; Integrated optics; Optical sensors; System-on-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
Conference_Location
Guilin
Print_ISBN
978-1-4799-3296-2
Type
conf
DOI
10.1109/ICSICT.2014.7021170
Filename
7021170
Link To Document