Thermal sensor and test technology improving for automotive ICS

Analog ICs are widely used in automotive, industrial and consumer area. ICs working environment such as the temperature is the major fact which affect the performance of ICs. The top lead semiconductor companies all on research for developing integrated temperature sensor inside their ICs. This article investigates the method of thermal sensor structure and the test technology improving on automatic test equipment. The high accuracy testing method and system configuration are presented on Intelligent Distribution Controller (IDC) IC. The experiment result shows this method has higher accurate to measure the real chip temperature than the traditional method (achieve ±2°C tolerance). The flash array is using for storing the temperature calibration data.