DocumentCode :
2415095
Title :
Electrical distribution for a reliable data center
Author :
Parise, Giuseppe ; Parise, Luigi
Author_Institution :
Electr. Eng. Dept., Sapienza Univ., Rome, Italy
fYear :
2012
fDate :
7-11 Oct. 2012
Firstpage :
1
Lastpage :
5
Abstract :
For the reliability of data centers the electrical distribution architecture has a vital impact on performances throughout its lifecycle. Special standards establish tier classifications for the site infrastructures. In a data center with two supplying systems, two UPS systems and dual-corded equipment, the switchboard design of supplied by each UPS needs to plan periodic maintenances without loss service continuity, the loads balancing, the future expansion and rehabilitation of the distribution (road map). The protection must be coordinated for the selectivity of the fault on the final circuits to ensure service continuity of the whole system. Equipment like electronic components are characterized by an excessive inrush current at start up that requests a tolerant protection coordination that is a technical inadmissible inaccuracy since to satisfy the fast start-up that remains inadequate for the data center service also for a lot of years. The failure of a final circuit not adequately selected and cleared can cause an impact on the fault selectivity on the switchboard section or on all the UPS supply. Starting systems for equipment should be adopted to solve the problem of inrush current and to allow an adequate protection coordination for the long service of the data center.
Keywords :
computer centres; power distribution faults; power distribution protection; power distribution reliability; uninterruptible power supplies; UPS supply; UPS systems; data centers reliability; dual-corded equipment; electrical distribution architecture; electronic components; fault selectivity; protection coordination; reliable data center; Circuit faults; Reliability; Surge protection; Switches; Switching circuits; Uninterruptible power systems; data center; dual cords; inrush current; protection; reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Society Annual Meeting (IAS), 2012 IEEE
Conference_Location :
Las Vegas, NV
ISSN :
0197-2618
Print_ISBN :
978-1-4673-0330-9
Electronic_ISBN :
0197-2618
Type :
conf
DOI :
10.1109/IAS.2012.6374107
Filename :
6374107
Link To Document :
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