DocumentCode
2415419
Title
Digital multi-relay protection for micro-grid systems
Author
Saleh, S.A. ; Ahshan, R.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of New Brunswick, Fredericton, NB, Canada
fYear
2012
fDate
7-11 Oct. 2012
Firstpage
1
Lastpage
8
Abstract
This paper presents the development, implementation and performances of a digital multi-relay protection for micro-grids. The developed digital protection is based on extracting the second level high frequency sub-bands present in d-q-axis components of the currents flowing through each bus of a micro-grid. The desired frequency sub-bands are extracted using the wavelet packet transform (WPT), and are considered signatures for identifying fault currents and fault locations. The protective functions in the developed digital multi-relay protection are structured without adaptive features or relay-to-relay communications. This structure is established to accomplish fast response, simple implementation, independent functions, and minor sensitivity to levels of fault currents. The digital multi-relay protection is implemented for experimental testing on a laboratory micro-grid for various operating conditions. Experimental performances demonstrate high reliability, accuracy, and speed, along with negligible sensitivity to parameters of protected components and mode of operating the micro-grid.
Keywords
distributed power generation; fault currents; fault location; power distribution faults; power distribution protection; relay protection; wavelet transforms; WPT; adaptive features; digital multirelay protection; fault currents; fault location; high frequency sub bands; high reliability; microgrid system; relay-to-relay communication; sensitivity; wavelet packet transform; Approximation methods; Protective relaying; Time frequency analysis; Transient analysis; Wavelet packets; Digital protective relays; micro-grids; power system protection; real-time systems; wavelet transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Society Annual Meeting (IAS), 2012 IEEE
Conference_Location
Las Vegas, NV
ISSN
0197-2618
Print_ISBN
978-1-4673-0330-9
Electronic_ISBN
0197-2618
Type
conf
DOI
10.1109/IAS.2012.6374120
Filename
6374120
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