DocumentCode
2415595
Title
Scalable fault-tolerant logic system based on regular array of locally interconnected gates
Author
Flak, Jacek ; Laiho, Mika ; Paasio, Ari
Author_Institution
VTT Tech. Res. Centre of Finland, Espoo
fYear
2008
fDate
14-16 July 2008
Firstpage
116
Lastpage
119
Abstract
This paper presents a new approach towards fault-tolerant information processing. The proposed system combines different types of redundancy into a solution suitable for implementation with nanodevices. The architecture is based on regular array of locally interconnected processing elements (PE). The interconnections are binary programmable in order to achieve network versatility. The array can be divided into a set of segments in a flexible manner, providing a means for implementing functions with different levels of complexity and redundancy.
Keywords
fault tolerant computing; logic circuits; logic gates; nanotechnology; fault-tolerant logic system; information processing; interconnected gates; interconnected processing elements; nanodevices; network versatility; CMOS technology; Circuit faults; Circuit noise; Energy efficiency; Fault tolerant systems; Integrated circuit interconnections; Logic arrays; Nanoscale devices; Power system reliability; Redundancy;
fLanguage
English
Publisher
ieee
Conference_Titel
Cellular Neural Networks and Their Applications, 2008. CNNA 2008. 11th International Workshop on
Conference_Location
Santiago de Compostela
Print_ISBN
978-1-4244-2089-6
Electronic_ISBN
978-1-4244-2090-2
Type
conf
DOI
10.1109/CNNA.2008.4588661
Filename
4588661
Link To Document