DocumentCode
241565
Title
Tunnel field-effect transistors - update
Author
Seabaugh, Alan ; Hao Lu
Author_Institution
Dept. of Electr. Eng., Univ. of Notre Dame, Notre Dame, IN, USA
fYear
2014
fDate
28-31 Oct. 2014
Firstpage
1
Lastpage
4
Abstract
Progress in the development of tunnel field-effect transistors (TFETs) is updated. Selected experimental demonstrations and simulations of sub-60-mV/decade TFETs are compared. A universal SPICE model is discussed which allows the unique attributes of the TFET to be represented across material systems and gate geometries to enable circuit design, with the intent of better informing the device development.
Keywords
SPICE; field effect transistors; semiconductor device models; tunnelling; TFET; circuit design; gate geometry; material system; tunnel field-effect transistor; universal SPICE model; Indium gallium arsenide; Integrated circuit modeling; Logic gates; Silicon; Transistors; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
Conference_Location
Guilin
Print_ISBN
978-1-4799-3296-2
Type
conf
DOI
10.1109/ICSICT.2014.7021205
Filename
7021205
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