Title :
Getting to zero - methods of reducing defects
Author :
Roesch, William J.
Author_Institution :
TriQuint Semicond. Inc., Hillsboro, OR, USA
Abstract :
This recount of a quality improvement journey will start at the top. First, two key philosophies of management will be explained. Next, several processes will be described which provided the framework for individual examples of improvement techniques. Ten specific improvement examples will be presented, each resulting in significant reductions in measured DPMs.
Keywords :
III-V semiconductors; gallium arsenide; quality management; reliability; GaAs; GaAs material reliability; defects per million; quality management; semiconductor processing; Continuous improvement; Fabrication; Management training; Measurement units; Quality management;
Conference_Titel :
GaAs Reliability Workshop, 2001. Proceedings
Print_ISBN :
0-7908-0066-7
DOI :
10.1109/GAASRW.2001.995730
