DocumentCode :
2417003
Title :
Reliability of metamorphic HEMTs on GaAs substrates
Author :
Marsh, P.F. ; Whelan, C.S. ; Hoke, W.E. ; Leoni, R.E., III ; Kazior, T.E.
Author_Institution :
Raytheon RF Components
fYear :
2001
fDate :
2001
Firstpage :
191
Lastpage :
202
Keywords :
Gallium arsenide; mHEMTs;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
GaAs Reliability Workshop, 2001. Proceedings
Print_ISBN :
0-7908-0066-7
Type :
conf
DOI :
10.1109/GAASRW.2001.995747
Filename :
995747
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2417003