DocumentCode
2417495
Title
Reliability considerations for metallized plastic film capacitors under high-stress AC waveforms
Author
Frantz, R.A.
Author_Institution
Bell Laboratories Whippany Road, Whippany, New Jersey
fYear
1981
fDate
June 29 1981-July 3 1981
Firstpage
81
Lastpage
90
Abstract
Power conversion circuits often apply AC waveforms to metallized plastic film capacitors whose characterization is largely based on DC testing. This paper describes failure mechanisms introduced by high-stress AC waveforms and ways of minimizing such failures.
Keywords
Capacitors; Dielectric films; Electrodes; Heating; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics Specialists Conference, 1981 IEEE
Conference_Location
Boulder, Colorado, USA
ISSN
0275-9306
Type
conf
DOI
10.1109/PESC.1981.7083628
Filename
7083628
Link To Document