Title :
Dependable embedded processor core for higher reliability
Author :
Kanbara, Hiroyuki ; Kinjo, Ryota ; Toda, Yuki ; Okuhata, Hiroyuki ; Ise, Masanao
Author_Institution :
ASTEM RI, Kyoto, Japan
Abstract :
We are developing a 32-bit embedded processor core with soft error detection and recovery mechanisms. Soft errors caused by atmospheric neutron hits or performance aging in an embedded processor core make the mission-critical embedded system to produce dangerous results like system failure. Our research goal is to investigate soft error rates in the proposed embedded processor core through fault injection tests using a neutron beam or an electromagnetic pulse generator.
Keywords :
VLSI; electromagnetic pulse; embedded systems; failure analysis; fault tolerance; integrated circuit reliability; microprocessor chips; neutron effects; pulse generators; radiation hardening (electronics); 32-bit embedded processor core; VLSI microprocessors; atmospheric neutron hit; electromagnetic pulse generator; fault injection test; mission-critical embedded system; performance aging; recovery mechanism; reliability; soft error detection; Aging; EMP radiation effects; Embedded system; Error analysis; Mission critical systems; Neutrons; Particle beams; Pulse generation; Registers; Testing; Embedded System; Error detection; Soft Errors;
Conference_Titel :
Consumer Electronics, 2009. ISCE '09. IEEE 13th International Symposium on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4244-2975-2
Electronic_ISBN :
978-1-4244-2976-9
DOI :
10.1109/ISCE.2009.5157061
