Dependable embedded processor core for higher reliability

Author

Kanbara, Hiroyuki ; Kinjo, Ryota ; Toda, Yuki ; Okuhata, Hiroyuki ; Ise, Masanao

Author_Institution

ASTEM RI, Kyoto, Japan

fYear

2009

fDate

25-28 May 2009

Firstpage

819

Lastpage

822

Abstract

We are developing a 32-bit embedded processor core with soft error detection and recovery mechanisms. Soft errors caused by atmospheric neutron hits or performance aging in an embedded processor core make the mission-critical embedded system to produce dangerous results like system failure. Our research goal is to investigate soft error rates in the proposed embedded processor core through fault injection tests using a neutron beam or an electromagnetic pulse generator.

Keywords

VLSI; electromagnetic pulse; embedded systems; failure analysis; fault tolerance; integrated circuit reliability; microprocessor chips; neutron effects; pulse generators; radiation hardening (electronics); 32-bit embedded processor core; VLSI microprocessors; atmospheric neutron hit; electromagnetic pulse generator; fault injection test; mission-critical embedded system; performance aging; recovery mechanism; reliability; soft error detection; Aging; EMP radiation effects; Embedded system; Error analysis; Mission critical systems; Neutrons; Particle beams; Pulse generation; Registers; Testing; Embedded System; Error detection; Soft Errors;

fLanguage

English

Publisher

ieee

Conference_Titel

Consumer Electronics, 2009. ISCE '09. IEEE 13th International Symposium on

Conference_Location

Kyoto

Print_ISBN

978-1-4244-2975-2

Electronic_ISBN

978-1-4244-2976-9

Type

conf

DOI

10.1109/ISCE.2009.5157061

Filename

5157061