• DocumentCode
    241846
  • Title

    Digital integrated temperature sensors for VLSI thermal management

  • Author

    Shuang Xie ; Wai Tung Ng

  • Author_Institution
    Edward S. Rogers Sr. Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada
  • fYear
    2014
  • fDate
    28-31 Oct. 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    VLSI thermal management system requires integrated temperature sensors to monitor on-chip hot spots. This paper reviews delay-line based integrated digital temperature sensors. More importantly, various calibration techniques for the delay-line based temperature sensor will also be discussed. In particular, an all-digital self-calibrated temperature sensor implemented entirely on an Altera Cyclone IV FPGA will be introduced. This work is further demonstrated on an emulated multi-core system to obtain the runtime thermal profiles of four different cores to facilitate the implementation of different VLSI thermal management schemes.
  • Keywords
    VLSI; calibration; delay lines; field programmable gate arrays; integrated circuit measurement; temperature measurement; temperature sensors; Altera Cyclone IV FPGA; VLSI thermal management system; all-digital self-calibrated temperature sensor; calibration techniques; delay-line based integrated digital temperature sensors; emulated multicore system; on-chip hot spot monitoring; runtime thermal profiles; CMOS integrated circuits; Calibration; Photonic band gap; Temperature measurement; Temperature sensors; Thermal management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4799-3296-2
  • Type

    conf

  • DOI
    10.1109/ICSICT.2014.7021346
  • Filename
    7021346