DocumentCode :
241846
Title :
Digital integrated temperature sensors for VLSI thermal management
Author :
Shuang Xie ; Wai Tung Ng
Author_Institution :
Edward S. Rogers Sr. Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada
fYear :
2014
fDate :
28-31 Oct. 2014
Firstpage :
1
Lastpage :
4
Abstract :
VLSI thermal management system requires integrated temperature sensors to monitor on-chip hot spots. This paper reviews delay-line based integrated digital temperature sensors. More importantly, various calibration techniques for the delay-line based temperature sensor will also be discussed. In particular, an all-digital self-calibrated temperature sensor implemented entirely on an Altera Cyclone IV FPGA will be introduced. This work is further demonstrated on an emulated multi-core system to obtain the runtime thermal profiles of four different cores to facilitate the implementation of different VLSI thermal management schemes.
Keywords :
VLSI; calibration; delay lines; field programmable gate arrays; integrated circuit measurement; temperature measurement; temperature sensors; Altera Cyclone IV FPGA; VLSI thermal management system; all-digital self-calibrated temperature sensor; calibration techniques; delay-line based integrated digital temperature sensors; emulated multicore system; on-chip hot spot monitoring; runtime thermal profiles; CMOS integrated circuits; Calibration; Photonic band gap; Temperature measurement; Temperature sensors; Thermal management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4799-3296-2
Type :
conf
DOI :
10.1109/ICSICT.2014.7021346
Filename :
7021346
Link To Document :
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