DocumentCode
2418600
Title
Design of Support Vector Machines with Time Frequency Kernels for classification of EEG signals
Author
Kumar, Ajit ; Mohanty, Mihir N. ; Routray, Aurobinda
Author_Institution
EE Dept., IIT Kharagpur, Kharagpur, India
fYear
2010
fDate
3-4 April 2010
Firstpage
330
Lastpage
333
Abstract
The paper presents a classification method for EEG signals using Support Vector Machines (SVM) with Time-Frequency Kernels. Because of the non-stationary nature, the EEG signals do not exhibit unique characteristics in the frequency domain. Therefore, Time- Frequency transformations have been suggested to extract the common features for a particular mental task performed by different subjects. The Short-Time-Fourier-Transform (STFT) and Wigner-Ville type of Time-Frequency Kernels have been chosen for transforming the input data space into the feature space. Experimental results show that SVM classifiers using such feature vectors are very effective for classification of the EEG signals. The data obtained from ten different subjects each performing three different mental tasks, have been used for testing this method. The major contribution of this paper is in testing the different Time-Frequency Kernels belonging to Cohen´s class. A comparative assessment of the classification performance with the conventional Gaussian Kernels in Time as well as Frequency domain has been also performed.
Keywords
Fourier transforms; electroencephalography; feature extraction; medical signal processing; neurophysiology; pattern classification; support vector machines; EEG signal classification; STFT time-frequency kernel; SVM classifiers; SVM design; Wigner-Ville type time-frequency kernel; feature extraction; feature space; feature vectors; mental task; short time Fourier transform; support vector machines; time-frequency kernels; time-frequency transformations; Data mining; Electroencephalography; Feature extraction; Frequency domain analysis; Kernel; Signal design; Support vector machine classification; Support vector machines; Testing; Time frequency analysis; EEG Classification; Time-Frequency Kernels; support-vector machine;
fLanguage
English
Publisher
ieee
Conference_Titel
Students' Technology Symposium (TechSym), 2010 IEEE
Conference_Location
Kharagpur
Print_ISBN
978-1-4244-5975-9
Electronic_ISBN
978-1-4244-5974-2
Type
conf
DOI
10.1109/TECHSYM.2010.5469169
Filename
5469169
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