• DocumentCode
    2418600
  • Title

    Design of Support Vector Machines with Time Frequency Kernels for classification of EEG signals

  • Author

    Kumar, Ajit ; Mohanty, Mihir N. ; Routray, Aurobinda

  • Author_Institution
    EE Dept., IIT Kharagpur, Kharagpur, India
  • fYear
    2010
  • fDate
    3-4 April 2010
  • Firstpage
    330
  • Lastpage
    333
  • Abstract
    The paper presents a classification method for EEG signals using Support Vector Machines (SVM) with Time-Frequency Kernels. Because of the non-stationary nature, the EEG signals do not exhibit unique characteristics in the frequency domain. Therefore, Time- Frequency transformations have been suggested to extract the common features for a particular mental task performed by different subjects. The Short-Time-Fourier-Transform (STFT) and Wigner-Ville type of Time-Frequency Kernels have been chosen for transforming the input data space into the feature space. Experimental results show that SVM classifiers using such feature vectors are very effective for classification of the EEG signals. The data obtained from ten different subjects each performing three different mental tasks, have been used for testing this method. The major contribution of this paper is in testing the different Time-Frequency Kernels belonging to Cohen´s class. A comparative assessment of the classification performance with the conventional Gaussian Kernels in Time as well as Frequency domain has been also performed.
  • Keywords
    Fourier transforms; electroencephalography; feature extraction; medical signal processing; neurophysiology; pattern classification; support vector machines; EEG signal classification; STFT time-frequency kernel; SVM classifiers; SVM design; Wigner-Ville type time-frequency kernel; feature extraction; feature space; feature vectors; mental task; short time Fourier transform; support vector machines; time-frequency kernels; time-frequency transformations; Data mining; Electroencephalography; Feature extraction; Frequency domain analysis; Kernel; Signal design; Support vector machine classification; Support vector machines; Testing; Time frequency analysis; EEG Classification; Time-Frequency Kernels; support-vector machine;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Students' Technology Symposium (TechSym), 2010 IEEE
  • Conference_Location
    Kharagpur
  • Print_ISBN
    978-1-4244-5975-9
  • Electronic_ISBN
    978-1-4244-5974-2
  • Type

    conf

  • DOI
    10.1109/TECHSYM.2010.5469169
  • Filename
    5469169