• DocumentCode
    2418615
  • Title

    The Effects of Mechanical Thin-film Properties on the Pyroelectric Signals

  • Author

    Wei, Chung-Sheng ; Hsiao, Chun-Ching ; Hu, Yuh-Chung

  • Author_Institution
    Nano-Electro-Mech.-Syst. Res. Center, National Taiwan Univ.
  • fYear
    2007
  • fDate
    16-19 Jan. 2007
  • Firstpage
    337
  • Lastpage
    341
  • Abstract
    The ZnO pyroelectric sensors with configuration of partially covered electrode were used to discuss the correlation between its voltage responsivity, morphology and mechanical properties of the thin film. The sensor based on pyroelectric thin film deposited by sputtering with RF power of 120 W was revealed higher voltage responsivity than those of 150 W and 90 W for 10-400 times. Meanwhile, the surface morphology reveals less defects and uniform grain size for the RF power of 120 W as characterized by SEM, which can be a symptom of the high voltage responsivity. On the other hand, the effective elastic modulus and hardness of ZnO film sputtered with RF power of 120 W were significantly (P Lt 0.05) larger than that of 90 W (21%) and (32%), and 150 W about 23% and 37%, respectively. Therefore, the effects of sputtering power on the voltage responsivity of the pyroelectric sensor can be analyzed and interpreted by the SEM morphology and its mechanical properties.
  • Keywords
    elastic moduli; pyroelectric detectors; scanning electron microscopy; sputtering; surface morphology; thin films; wide band gap semiconductors; zinc compounds; 120 W; 150 W; 90 W; SEM morphology; ZnO; elastic modulus; mechanical properties; nanoindentation; pyroelectric sensors; pyroelectric signals; pyroelectric thin film; sputtering; surface morphology; voltage responsivity; Mechanical factors; Mechanical sensors; Morphology; Pyroelectricity; Radio frequency; Sputtering; Thin film sensors; Transistors; Voltage; Zinc oxide; ZnO; mechanical property; nanoindentation; pyroelectric sensor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems, 2007. NEMS '07. 2nd IEEE International Conference on
  • Conference_Location
    Bangkok
  • Print_ISBN
    1-4244-0610-2
  • Type

    conf

  • DOI
    10.1109/NEMS.2007.352014
  • Filename
    4160333