• DocumentCode
    2418626
  • Title

    Diagnostic testing of MV XLPE cables with low density of water trees

  • Author

    Hvidsten, Sverre ; Benjaminsen, Jan Tore

  • Author_Institution
    SINTEF Energy Res., Trondheim, Norway
  • fYear
    2002
  • fDate
    7-10 Apr 2002
  • Firstpage
    108
  • Lastpage
    111
  • Abstract
    In this paper, results from diagnostic measurements performed on service aged 12 and 24 kV (MV) XLPE cables equipped with strippable insulation screens are reported. The main purpose of this work has been to examine if condition assessment can be performed on such cables having typically low density of vented water trees. The actual condition of the cables was determined by laboratory AC breakdown tests and water tree examinations performed on the same cables. Secondly, the influence on the diagnostic testing of the joints installed on the cables has been examined. The results show that it is not possible to distinguish the ageing status for cables having breakdown voltages of 5 U. and higher. The evaluation criteria need to be further developed, in order to examine if the condition of cables with breakdown voltages lower than 5 U. can be reliably assessed. Joints with resistive field grading can have very high resistive losses preventing a reliable condition assessment of the cable insulation
  • Keywords
    XLPE insulation; ageing; electric breakdown; fault diagnosis; insulation testing; power cable insulation; power cable testing; 12 kV; 24 kV; MV XLPE power cables; ageing status; breakdown voltages; condition assessment; diagnostic measurements; laboratory AC breakdown tests; power cable diagnostic testing; service ageing; strippable insulation screens; water trees; Aging; Cable insulation; Dielectric loss measurement; Dielectric measurements; Dielectrics and electrical insulation; Laboratories; Medium voltage; Performance evaluation; Testing; Trees - insulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 2002. Conference Record of the 2002 IEEE International Symposium on
  • Conference_Location
    Boston, MA
  • Print_ISBN
    0-7803-7337-5
  • Type

    conf

  • DOI
    10.1109/ELINSL.2002.995892
  • Filename
    995892