• DocumentCode
    2419474
  • Title

    Seizure prediction for epilepsy using a multi-stage phase synchrony based system

  • Author

    James, Christopher J. ; Gupta, Disha

  • Author_Institution
    Signal Process. & Control Group, Univ. of Southampton, Southampton, UK
  • fYear
    2009
  • fDate
    3-6 Sept. 2009
  • Firstpage
    25
  • Lastpage
    28
  • Abstract
    Seizure onset prediction in epilepsy is a challenge which is under investigation using many and varied signal processing techniques. Here we present a multi-stage phase synchrony based system that brings to bear the advantages of many techniques in each substage. The 1st stage of the system unmixes continuous long-term (2-4 days) multichannel scalp EEG using spatially constrained Independent Component Analysis and estimates the long term significant phase synchrony dynamics of narrowband (2-8 Hz and 8-14 Hz) seizure components. It then projects multidimensional features onto a 2-D map using Neuroscale and evaluates the probability of predictive events using Gaussian Mixture Models. We show the possibility of seizure onset prediction within a prediction window of 35-65 minutes with a sensitivity of 65-100% and specificity of 65-80% across epileptic patients.
  • Keywords
    Gaussian processes; diseases; electroencephalography; feature extraction; independent component analysis; medical signal processing; prediction theory; synchronisation; Gaussian mixture models; Neuroscale; continuous long-term multichannel scalp EEG; epilepsy; feature extraction; frequency 2 Hz to 14 Hz; multi-stage phase synchrony; multidimensional features; seizure prediction; spatially constrained independent component analysis; Algorithms; Artificial Intelligence; Diagnosis, Computer-Assisted; Electroencephalography; Epilepsy; Humans; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE
  • Conference_Location
    Minneapolis, MN
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-3296-7
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2009.5334898
  • Filename
    5334898