DocumentCode :
2420063
Title :
Improved low-frequency performance of pyramid-cone absorbers for application in semi-anechoic chambers
Author :
Kuester, Edward F. ; Holloway, Christopher L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Colorado Univ., Boulder, CO, USA
fYear :
1989
fDate :
23-25 May 1989
Firstpage :
394
Lastpage :
399
Abstract :
A mathematical model, developed by the authors to describe the low-frequency reflection properties of arrays of pyramid-cone absorbers, is used to improve the design of these cones in the range of 30 to 300 MHz. The model shows that at frequencies such that the transverse spacing of the cones is small compared to a wavelength, a reflecting wave is not influenced by the individual cones, but rather the wave is acted upon as if only a one-dimensionally layered, anisotropic equivalent medium exists, whose parameters depend on the geometry and electrical composition of the cones. It is thus possible using elementary means to calculate the reflection coefficient of an arbitrarily polarized and incident plane wave from an array of these cones and hence to assess their performance in an anechoic chamber. Results of the application of this design to semianechoic measurement chambers are presented. These are found to provide closer correlation to the site attenuation curves for an ideal open-field test site
Keywords :
anechoic chambers; electromagnetic interference; electromagnetic wave absorption; electromagnetic wave reflection; 30 to 300 MHz; EMI; LF performance; LF reflection properties; VHF; correlation; electrical composition; geometry; incident plane wave; mathematical model; open-field test site; pyramid-cone absorbers; reflecting wave; reflection coefficient; semianechoic measurement chambers; site attenuation curves; transverse spacing; wavelength; Anechoic chambers; Anisotropic magnetoresistance; Attenuation; Frequency; Geometry; Mathematical model; Polarization; Reflection; Solid modeling; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1989., IEEE 1989 National Symposium on
Conference_Location :
Denver, CO
Type :
conf
DOI :
10.1109/NSEMC.1989.37217
Filename :
37217
Link To Document :
بازگشت