• DocumentCode
    2420213
  • Title

    Development of conductive adhesives filled with low-melting-point alloy fillers

  • Author

    Lu, Daoqiang ; Wong, C.P.

  • Author_Institution
    Sch. of Mater. Sci. & Eng. & Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    7
  • Lastpage
    13
  • Abstract
    Conventional isotropic conductive adhesives (ICAs) are composed of a polymeric matrix with silver flakes. As an alternative to lead-bearing solder, ICAs offer a number of benefits, but limitations do exist for ICA technology. ICAs filled with silver flakes generally show higher initial contact resistance, unstable contact resistance, and inferior impact strength. In this study, a new class of isotropic conductive adhesives was developed by using two different fillers, a silver flake and a low melting point alloy filler, in the ICA formulations. After curing, the metallurgical connection between the silver particles and between the silver particles and the nickel (Ni) substrate was observed using scanning electron microscopy (SEM). Initial contact resistance and contact resistance shift during elevated temperature and humidity aging of the formulated ICAs on a non-noble metal (nickel) were investigated and compared to those of ICA filled only with the silver flake. It was found that (a) the low-melting-point alloy filler could wet the Ag flakes and nickel (Ni) substrate very well and formed metallurgical connections; and (b) this ICA showed especially low initial contact resistance and stable contact resistance during aging on nickel metal compared to the ICA filled only with silver flakes
  • Keywords
    adhesives; ageing; conducting materials; contact resistance; filled polymers; scanning electron microscopy; Ag; Ni; contact resistance; curing; elevated temperature aging; humidity aging; impact strength; isotropic conductive adhesive; low-melting-point alloy filler; metallurgical connection; nickel substrate; polymeric matrix; scanning electron microscopy; silver flakes; Aging; Conductive adhesives; Contact resistance; Curing; Independent component analysis; Lead; Nickel; Polymers; Scanning electron microscopy; Silver;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials: Processes, Properties andInterfaces, 2000. Proceedings. International Symposium on
  • Conference_Location
    Braselton, GA
  • Print_ISBN
    0-930815-59-9
  • Type

    conf

  • DOI
    10.1109/ISAPM.2000.869235
  • Filename
    869235