• DocumentCode
    242036
  • Title

    Thermal analysis of multiple light sources based on the superposition method

  • Author

    Dong Shi ; Shiwei Feng ; Yamin Zhang ; Junwei Yang

  • Author_Institution
    Coll. of Electron. Inf. & Control Eng., Beijing Univ. of Technol., Beijing, China
  • fYear
    2014
  • fDate
    28-31 Oct. 2014
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    In this paper, the superposition method is used to investigate the complete temperature field of a package with multiple chips and a module with multiple packages, based on the results of transient temperature rise measurements and the thermal resistance coupling matrix. In the case of a package with multiple chips, such as a RGBW LED package with four chips inside, the different power and TSP (temperature sensitive parameter) cause the uneven temperature distribution, while in other case of an array with 16 packages also dose because of separation distance and distribution. It was shown that the thermal resistance coupling matrix can provide relatively accurate and reliable self-heating and coupling temperature rise data.
  • Keywords
    matrix algebra; semiconductor device packaging; temperature distribution; thermal analysis; RGBW LED package; coupling temperature rise data; multiple light sources; superposition method; temperature sensitive parameter; thermal analysis; thermal resistance coupling matrix; transient temperature rise measurements; uneven temperature distribution; Abstracts; Arrays; Couplings; Lead; Light emitting diodes; Reliability; Thermal analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4799-3296-2
  • Type

    conf

  • DOI
    10.1109/ICSICT.2014.7021444
  • Filename
    7021444