DocumentCode
242036
Title
Thermal analysis of multiple light sources based on the superposition method
Author
Dong Shi ; Shiwei Feng ; Yamin Zhang ; Junwei Yang
Author_Institution
Coll. of Electron. Inf. & Control Eng., Beijing Univ. of Technol., Beijing, China
fYear
2014
fDate
28-31 Oct. 2014
Firstpage
1
Lastpage
3
Abstract
In this paper, the superposition method is used to investigate the complete temperature field of a package with multiple chips and a module with multiple packages, based on the results of transient temperature rise measurements and the thermal resistance coupling matrix. In the case of a package with multiple chips, such as a RGBW LED package with four chips inside, the different power and TSP (temperature sensitive parameter) cause the uneven temperature distribution, while in other case of an array with 16 packages also dose because of separation distance and distribution. It was shown that the thermal resistance coupling matrix can provide relatively accurate and reliable self-heating and coupling temperature rise data.
Keywords
matrix algebra; semiconductor device packaging; temperature distribution; thermal analysis; RGBW LED package; coupling temperature rise data; multiple light sources; superposition method; temperature sensitive parameter; thermal analysis; thermal resistance coupling matrix; transient temperature rise measurements; uneven temperature distribution; Abstracts; Arrays; Couplings; Lead; Light emitting diodes; Reliability; Thermal analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
Conference_Location
Guilin
Print_ISBN
978-1-4799-3296-2
Type
conf
DOI
10.1109/ICSICT.2014.7021444
Filename
7021444
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