DocumentCode :
2420437
Title :
Material challenges for wafer level packaging
Author :
Ma, Bodan ; Zhang, Eric ; Hong, Sun Hee ; Tong, Quinn ; Savoca, Ann
Author_Institution :
Nat. Starch & Chem. Co., Bridgewater, NJ, USA
fYear :
2000
fDate :
2000
Firstpage :
68
Lastpage :
73
Abstract :
Flip chip as the smallest packaging design has been used in more and more electronic applications. Flip chip underfill is an essential component for the reliability of the package. Currently, the dispensing process is done on each individual chip level after the solder interconnects have been made. The device then has to go through a separate curing process to harden the underfill material. The current underfilling process is cumbersome and is one of the cost drivers of flip chip application. In wafer level flip chip packaging, the dispensing is made over the whole wafer in one step. After dicing, the reflow and the curing of underfill will be accomplished also in one step. The saving on process cost will be substantial. The new process brings new challenges to underfill material development. In addition to performing the reinforcement role as an underfill, these new materials have to be compatible with the proposed wafer level process. In addition, the underfill material has to act as a fluxing agent during solder reflow. The underfill materials also have to demonstrate good room temperature stability after being dispensed onto wafer, handled at ambient environment, and before being cured in the reflow oven. The authors will discuss the parameters that determine the material performance at each processing step as well as the material development effort in a wafer-level underfill development program, which is sponsored by the Advanced Technology Program (ATP)
Keywords :
encapsulation; flip-chip devices; integrated circuit packaging; integrated circuit reliability; Advanced Technology Program; dispensing; flip chip underfill; fluxing agent; material development; packaging design; process cost; reflow oven; reliability; room temperature stability; wafer level packaging; Chemicals; Costs; Curing; Electronics packaging; Flip chip; Semiconductor materials; Stability; Sun; Temperature; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Packaging Materials: Processes, Properties andInterfaces, 2000. Proceedings. International Symposium on
Conference_Location :
Braselton, GA
Print_ISBN :
0-930815-59-9
Type :
conf
DOI :
10.1109/ISAPM.2000.869245
Filename :
869245
Link To Document :
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