• DocumentCode
    2421228
  • Title

    Development of new reworkable epoxy resins for flip chip underfill applications

  • Author

    Li, Haiying ; Wang, Lejun ; Wong, C.P.

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    289
  • Lastpage
    294
  • Abstract
    Underfill is a polymeric material used in the flip-chip devices that fills the gap between an IC chip and an organic board, and encapsulates the solder interconnects. This underfill material can dramatically enhance the reliability of the flip-chip devices as compared to non-underfilled devices. Current employed underfills are mainly silica filled epoxy-based materials that are not reworkable after curing, an obstacle in Flip-Chip on Board (FCOB) and Multi-chip Module (MCM) technology developments where unknown bad dies is still a concern. Reworkable underfill is the key material to address the non-reworkability of the FCOB packages. We have synthesized a series of thermally degradable epoxies that show good reworkability. However, all these epoxies have degradation temperature higher than 250°C. Besides, they are cycloaliphatic-only-based which have shown weakness in toughness and thus may not perform well for very high reliability applications. In the search for high performance epoxy resins for reworkable underfills, our approach is to incorporate aromatic moiety and thermally labile group that decomposes around solder reflow temperature. This paper reports part of our recent approach in the study and development of new epoxy resins that may offer better rework properties. Two new diepoxides containing tertiary ester, tertiary carbonate, and aromatic moieties were synthesized. These epoxy compounds exist as liquids at ambient temperature. The curing properties of these two epoxides and thermal properties of cured resins of these epoxy compounds were characterized with DSC, TGA and TMA
  • Keywords
    encapsulation; flip-chip devices; polymers; thermal analysis; DSC; FCOB package; MCM package; TGA; TMA; curing; diepoxide; epoxy resin; flip-chip device; polymeric material; reflow soldering; reliability; reworkability; thermal degradation; thermal properties; underfill encapsulant; Curing; Epoxy resins; Flip chip; Materials reliability; Organic materials; Packaging; Polymers; Silicon compounds; Temperature; Thermal degradation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials: Processes, Properties andInterfaces, 2000. Proceedings. International Symposium on
  • Conference_Location
    Braselton, GA
  • Print_ISBN
    0-930815-59-9
  • Type

    conf

  • DOI
    10.1109/ISAPM.2000.869287
  • Filename
    869287