• DocumentCode
    242123
  • Title

    Low frequency noise characterization of advanced and end of the roadmap devices

  • Author

    Claeys, Cor ; Simoen, Eddy

  • Author_Institution
    IMEC, Leuven, Belgium
  • fYear
    2014
  • fDate
    28-31 Oct. 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Recent insights in the understanding and use of noise analysis for the quantitative characterization of the device quality are highlighted. Subsequently, typical examples are given to illustrate the low frequency noise performance of advanced CMOS technologies and devices.
  • Keywords
    CMOS integrated circuits; advanced CMOS technologies; low frequency noise characterization; quantitative characterization; roadmap devices; Abstracts; Graphene; Logic gates; MOSFET circuits; Noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4799-3296-2
  • Type

    conf

  • DOI
    10.1109/ICSICT.2014.7021488
  • Filename
    7021488
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=242123