Title :
Low frequency noise characterization of advanced and end of the roadmap devices
Author :
Claeys, Cor ; Simoen, Eddy
Author_Institution :
IMEC, Leuven, Belgium
Abstract :
Recent insights in the understanding and use of noise analysis for the quantitative characterization of the device quality are highlighted. Subsequently, typical examples are given to illustrate the low frequency noise performance of advanced CMOS technologies and devices.
Keywords :
CMOS integrated circuits; advanced CMOS technologies; low frequency noise characterization; quantitative characterization; roadmap devices; Abstracts; Graphene; Logic gates; MOSFET circuits; Noise;
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4799-3296-2
DOI :
10.1109/ICSICT.2014.7021488
