• DocumentCode
    2421395
  • Title

    Electrical characterizations and considerations of electrically conductive adhesives (ECAs)

  • Author

    Shimada, Yasushi ; Lu, Daoqiang ; Wong, C.P.

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    336
  • Lastpage
    342
  • Abstract
    Electrically conductive adhesives (ECAs) have been developed as an alternative for traditional tin/lead (Sn/Pb) solders for electronic interconnect applications. The low processing temperature, the elimination of lead, the no-flux, no-clean process and the simple process are some of the advantages of using ECAs. However, compared to the mature soldering technology, conductive adhesive technology is still in its infancy, as such, there are some limitations for current commercial ECAs. In addition to the conductivity fatigue and poor impact strength, electrically conductive adhesives tend to have lower current carrying density as compared to the conventional Sn/Pb solder. This is mainly due to the difference in the electrical conductive mechanisms of ECAs. Generally speaking, ECAs have high contact resistance than metallurgical solders. As such, high frequency and high power devices may require high current density and high performance ECAs. In this paper, we will focus our study on current capacity measurements and other electrical properties, such as inductance, capacitance and resistance with the LCR meter and the four point probe both in the DC and AC ranges of the ECAs. Furthermore, we will discuss the electrical performance of these ECAs for the high performance electronic applications
  • Keywords
    adhesives; conducting materials; contact resistance; current density; LCR parameters; capacitance; conductivity fatigue; contact resistance; current density; electrical characteristics; electrically conductive adhesive; electronic interconnect; four-point probe method; high frequency device; high power device; impact strength; inductance; no-flux no-clean process; resistance; Conductive adhesives; Conductivity; Contact resistance; Current density; Fatigue; Frequency; Lead; Soldering; Temperature; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials: Processes, Properties andInterfaces, 2000. Proceedings. International Symposium on
  • Conference_Location
    Braselton, GA
  • Print_ISBN
    0-930815-59-9
  • Type

    conf

  • DOI
    10.1109/ISAPM.2000.869295
  • Filename
    869295