DocumentCode :
242145
Title :
Efficient pattern generation for transition-fault diagnosis using combinational circuit model
Author :
Yi-Da Wang ; Kuen-Jong Lee
Author_Institution :
Dept. of EE, Nat. Cheng Kung Univ., Tainan, Taiwan
fYear :
2014
fDate :
28-31 Oct. 2014
Firstpage :
1
Lastpage :
4
Abstract :
An efficient diagnosis procedure to distinguish non-equivalent transition faults and identify equivalent transition faults is proposed. This procedure consists of three main methods. The Fault Inactivation Method (FIM) generates diagnosis patterns to distinguish fault pairs by inactivating one fault and detecting the other for each fault pair, the Fault Pair Filter Method (FPF) quickly identifies a large portion of equivalent-fault pairs after FIM, and the Fault Propagation Method (FPM) generates diagnosis patterns for the remaining distinguishable fault pairs and identifies equivalent-fault pairs by initializing both faults in each pair simultaneously and creating distinguishable faulty responses. Experimental results show that only 6 out of more than 7.48*108 fault pairs in ISCAS89 benchmark circuits cannot be handled by this method, i.e., a diagnosis resolution of higher than 99.999999%is achieved.
Keywords :
automatic test pattern generation; combinational circuits; fault diagnosis; integrated circuit testing; logic testing; ISCAS89 benchmark circuits; combinational circuit model; fault inactivation method; fault pair filter method; fault propagation method; nonequivalent transition faults; transition-fault diagnosis; Circuit analysis; Circuit faults; Fault diagnosis; Gold;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4799-3296-2
Type :
conf
DOI :
10.1109/ICSICT.2014.7021499
Filename :
7021499
Link To Document :
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