Title :
Organizational tailoring of the CMM questionnaire for internal process improvement [software development management]
Author :
Pryor, Alan N. ; Mcguire, Eugene G.
Author_Institution :
Syst. Group Inf. Technol., Texas Instrum. Inc., Plano, TX, USA
Abstract :
Some organizations are attempting to reduce the time and cost required by formal process improvement models by tailoring those models to specific needs. This paper describes a tailored version of the Software Engineering Institute´s (SEI) capability maturity model (CMM) questionnaire which was developed by a large US-based Fortune 500 company for low-cost internal process improvement purposes
Keywords :
software development management; software houses; software quality; Fortune 500 company; Software Engineering Institute; USA; capability maturity model questionnaire; formal process improvement models; internal process improvement; software development management; software houses; Capability maturity model; Coordinate measuring machines; Costs; Information management; Project management; Quality management; Software engineering; Software quality; Subcontracting; Technology management;
Conference_Titel :
Innovation in Technology Management - The Key to Global Leadership. PICMET '97: Portland International Conference on Management and Technology
Conference_Location :
Portland, OR
Print_ISBN :
0-7803-3574-0
DOI :
10.1109/PICMET.1997.653536
