Title :
Antiferromagnetic exchange coupled and soft adjacent layer biasings for an MR head by triode sputter deposited films
Author :
Das, S.C. ; Gyasi, K. ; Johnson, A. ; Chaurette, W.
Author_Institution :
Digital Equipment Corporation
Keywords :
Antiferromagnetic materials; Delta modulation; Diodes; Grain size; Magnetic films; Magnetic heads; Noise figure; Plasma confinement; Sputtering; Substrates;
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
DOI :
10.1109/INTMAG.1992.696269
