• DocumentCode
    2422536
  • Title

    Displacement current and trapping mechanisms of electric charges in TiO2-rutile

  • Author

    Temga, T. ; Guerret-Piecourt, C. ; Juvé, D. ; Tréheux, D. ; Jardin, C.

  • Author_Institution
    Ecole Centrale de Lyon, Ecully, France
  • fYear
    2003
  • fDate
    19-22 Oct. 2003
  • Firstpage
    221
  • Lastpage
    224
  • Abstract
    The Scanning Electron Microscopy Mirror Effect (SEMME) and the Induced Current Measurement (ICM) have been used to characterize insulators. The application of these methods to a semiconducting material of wide band gap (TiO2) reveals that the material presents a great leakage surface current and high anisotropy of dielectric properties. The goal of the present communication is to understand and study such a behaviour.
  • Keywords
    electric breakdown; leakage currents; scanning electron microscopy; titanium compounds; TiO2; TiO2-rutile; dielectric properties anisotropy; displacement current; electric charges; induced current measurement; insulators; leakage surface current; scanning electron microscopy mirror effect; trapping mechanisms; wide band gap; Anisotropic magnetoresistance; Current measurement; Dielectric materials; Dielectrics and electrical insulation; Electron traps; Mirrors; Scanning electron microscopy; Semiconductivity; Semiconductor materials; Wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2003. Annual Report. Conference on
  • Print_ISBN
    0-7803-7910-1
  • Type

    conf

  • DOI
    10.1109/CEIDP.2003.1254833
  • Filename
    1254833
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2422536