DocumentCode
2422853
Title
Insulator Film Thickness to Fix the Spacing between Electrodes to Molecular Length Scale
Author
Tyagi, Pawan ; Li, Dongfeng ; Holmes, Stephen M. ; Hinds, Bruce J.
Author_Institution
Dept. of Chem. & Mater. Eng. & Center for Nanoscale Sci. & Eng., Kentucky Univ., Lexington, KY
fYear
2007
fDate
16-19 Jan. 2007
Firstpage
191
Lastpage
194
Abstract
Successful fabrication of reliable and scalable molecular electrodes is a major challenge in the making practical molecular electronics devices. Most of the present day molecular electrodes suffer with short circuit, scalability, and reproducibility problems. Moreover only few metals, gold (Au) is the mostly used one, can be utilized due to limitations with current molecular electrode design. We have come up with a new approach that is not only reliable but also allows the use of wide range of metals, including magnetic metals, in molecular electrodes. We have prepared novel molecular electrodes utilizing the exposed edge of metal-insulator-metal cross junction. As much as 50 fold increase over bare tunnel junction current was noticed following molecule attachment. The molecular electrodes with as high as 90% yield and 10 months long device life, were produced by using optical photolithography and sputtering deposition method. Major obstacle in the fabrication of molecular electrode was the adverse effects of mechanical stresses on the stability on ~2nm insulator barrier used in the tunnel junctions.
Keywords
electrodes; gold; insulating materials; magnetoelectronics; molecular electronics; Au; insulator barrier; insulator film thickness; mechanical stresses; metal-insulator-metal cross junction; molecular electrodes; molecular electronics devices; optical photolithography; short circuit; spintronics; sputtering deposition; tunnel junction current; Circuits; Electrodes; Fabrication; Gold; Insulation; Metal-insulator structures; Molecular electronics; Optical devices; Reproducibility of results; Scalability; Molecular electronics; Spintronics;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems, 2007. NEMS '07. 2nd IEEE International Conference on
Conference_Location
Bangkok
Print_ISBN
1-4244-0610-2
Type
conf
DOI
10.1109/NEMS.2007.352259
Filename
4160562
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