• DocumentCode
    2423289
  • Title

    Calculation of current density along insulator surface using field and circuit theory approaches

  • Author

    El-Hag, A.H. ; Jayaram, S.H. ; Cherney, E.A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
  • fYear
    2003
  • fDate
    19-22 Oct. 2003
  • Firstpage
    375
  • Lastpage
    378
  • Abstract
    The paper presents two different methods to compute the current density along contaminated and wet silicone rubber insulator surface. The first method, based on field theory approach, uses the commercial software FEMLAB® to compute the current density. The conductivity of the contamination layer used in the calculations was extracted from the measured equivalent salt deposit density (ESDD) separately for different regions of the insulator surfaces. The second method is based on the circuit theory approach, and, the insulator surface was divided into different sections for resistance calculations to account for different contamination levels. Rankings based on the calculated current densities based on segmentation of the insulator surface for ESDD measurements match with those extracted from measured leakage currents.
  • Keywords
    current density; leakage currents; silicone rubber; surface contamination; surface resistance; circuit theory; contamination layer; current density; equivalent salt deposit density; field theory; insulator surface; leakage currents; wet silicone rubber insulator surface; Circuit theory; Current density; Current measurement; Density measurement; Electrical resistance measurement; Insulation; Pollution measurement; Rubber; Surface contamination; Surface resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2003. Annual Report. Conference on
  • Print_ISBN
    0-7803-7910-1
  • Type

    conf

  • DOI
    10.1109/CEIDP.2003.1254871
  • Filename
    1254871