DocumentCode
2423362
Title
Qualitative Analysis of Surface Energy Using Atomic Force Microscopy Approach
Author
Yeh, Yen-Liang ; Jang, Ming-Jyi ; Wang, Cheng Chi ; Chen, Kuang Sheng ; Lin, Yen-Pin
Author_Institution
Dept. of Autom. & Control Eng., Far East Univ.
fYear
2007
fDate
16-19 Jan. 2007
Firstpage
303
Lastpage
307
Abstract
This paper performs a qualitative analysis of the surface energy of copper (Cu), aluminum (Al), carbon steel (S45C) and alloy steel (SKD11) by analyzing the variation in the resonant frequency of the cantilever beam (Si3N4 ) of an atomic force microscope following repeated contacts with the specimen surface. In a pure material (Cu, Al and S45C), it is found that the adhesive mass on the tip of the cantilever beam saturates following repeated contacts with the surface. Since the adhesive mass is determined by the difference between the surface energy of the cantilever beam material and that of the test material, the surface energies of the cantilever beam and the pure materials can be qualitatively compared. However, for the alloy steel (SKD11), the adhesive mass varies after each contact and hence no conclusions can be made regarding its surface energy. The present results indicate that the surface energies of the cantilever beam and the pure materials can be ranked as follows: Cu>Si3N4 >Al>S45C. It has been shown that the surface energy of a rigid material (S45C) is less than that of a soft material (Cu).
Keywords
adhesion; alloy steel; aluminium; atomic force microscopy; cantilevers; carbon steel; copper; resonance; silicon compounds; surface energy; AFM; Al; Cu; S45C; SKD11; Si3N4; adhesive mass; alloy steel; atomic force microscope; atomic force microscopy; cantilever beam; carbon steel; resonant frequency variation; surface energy; Aluminum alloys; Atomic beams; Atomic force microscopy; Copper alloys; Iron alloys; Performance analysis; Resonant frequency; Silicon alloys; Steel; Structural beams; AFM; Adhesion; Resonantfrequency; Surface energy;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems, 2007. NEMS '07. 2nd IEEE International Conference on
Conference_Location
Bangkok
Print_ISBN
1-4244-0610-2
Type
conf
DOI
10.1109/NEMS.2007.352032
Filename
4160590
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