Title :
Noise characteristics of a SPECT simulation system
Author :
Belanger, M.-J. ; Dobrzeniecki, A.B. ; Yanch, J.C.
Author_Institution :
Harvard-MIT Div. of Health Sci. & Technol., Cambridge, MA, USA
fDate :
31 Oct-6 Nov 1993
Abstract :
The noise characteristics of synthetic images generated by a Monte Carlo SPECT simulation package (Sim-SPECT) were examined. Sim-SPECT generates single planer projections via analog Monte Carlo methods but uses a directional photon cloning technique to simulate tomographic acquisition. Statistical noise characteristics were investigated in both single planar projection and tomographic acquisitions, the latter to assess the potential noise distortion of the directional cloning algorithm. The root-mean-square (EMS) and the noise power spectrum were two mathematical measures used to characterise the noise. NPS was estimated using spectral averaging techniques. Synthetic Sim-SPECT and experimental data (both single planar and tomographic acquisitions) were obtained using phantoms of identical dimensions and uniform activity
Keywords :
Monte Carlo methods; digital simulation; noise; single photon emission computed tomography; Monte Carlo SPECT simulation package; SPECT simulation system; directional cloning algorithm; directional photon cloning technique; mathematical measures; medical diagnostic imaging; noise characteristics; noise power spectrum; nuclear medicine; phantoms; root-mean-square; single planer projections; spectral averaging techniques; statistical noise characteristics; synthetic images; tomographic acquisition; Character generation; Cloning; Distortion measurement; Image generation; Medical services; Metalworking machines; Monte Carlo methods; Noise generators; Packaging; Single photon emission computed tomography;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1993., 1993 IEEE Conference Record.
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-1487-5
DOI :
10.1109/NSSMIC.1993.373548
