DocumentCode :
2423734
Title :
Single event upset characterization of the Pentium® 4, Pentium® III and low power Pentium® MMX microprocessors using proton irradiation
Author :
Hiemstra, David M. ; Yu, Simon ; Pop, Marius
Author_Institution :
MDRobotics, Brampton, Ont., Canada
fYear :
2002
fDate :
2002
Firstpage :
51
Lastpage :
57
Abstract :
Experimental single event upset characterization of the Pentium® 4, Pentium® III and Low Power Pentium® MMX microprocessors using proton irradiation is presented. Results are compared with previous tests on other Pentium® microprocessors.
Keywords :
integrated circuit reliability; integrated circuit testing; microprocessor chips; proton effects; space vehicle electronics; Low Power Pentium MMX microprocessors; Pentium 4 microprocessors; Pentium III microprocessors; microprocessor tests; proton irradiation; single event upset characterization; space radiation environment; CMOS process; Data flow computing; Manufacturing processes; Microprocessors; Protection; Protons; Single event upset; Space shuttles; Space stations; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation Effects Data Workshop, 2002 IEEE
Print_ISBN :
0-7803-7544-0
Type :
conf
DOI :
10.1109/REDW.2002.1045532
Filename :
1045532
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2423734
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